Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France

著者

• IEEE International Workshop on Memory Technology, Design, and Testing
• Courtois, B. (Bernard)
• Wik, T. (Thomas)
• Zorian, Yervant
• IEEE Computer Society
• IEEE Computer Society. Technical Committee on VLSI
• IEEE Computer Society. Test Technology Technical Council
• IEEE Solid-State Circuits Society

書誌事項

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France

editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society

IEEE Computer Society, c2002

• : bookbroker

タイトル別名

Memory technology, design and testing

注記

"IEEE Computer Society Order Number PR01617"--T.p. verso

"... 10th anniversary of the Workshop ..."--P. x

Includes bibliographical references and index

Also available via the World Wide Web

詳細情報

• NII書誌ID(NCID): BA64790086
• ISBN:
  • 0769516173
  • 0769516181
• LCCN: 2002512007
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xii, 182 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7895.M4
• 件名:
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Random access memory -- Congresses