Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France

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書誌事項

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France

editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society

IEEE Computer Society, c2002

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タイトル別名

Memory technology, design and testing

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注記

"IEEE Computer Society Order Number PR01617"--T.p. verso

"... 10th anniversary of the Workshop ..."--P. x

Includes bibliographical references and index

Also available via the World Wide Web

内容説明・目次

巻冊次

ISBN 9780769516172

内容説明

This text contains information on designing and testing computer hardware as presented at the 2002 IEEE International Memory Technology, Design and Testing (MTDT 2002).
巻冊次

: bookbroker ISBN 9780769516189

内容説明

"IEEE Computer Society Order Number PR01617"--T.p. verso.

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