Fault injection techniques and tools for embedded systems reliability evaluation

著者

• Benso, Alfredo
• Prinetto, Paolo

書誌事項

Fault injection techniques and tools for embedded systems reliability evaluation

edited by Alfredo Benso and Paolo Prinetto

（Frontiers in electronic testing, 23）

Kluwer Academic Publishers, c2003

注記

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA65055238
• ISBN:
  • 1402075898
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Boston
• ページ数/冊数: xiv, 241 p.
• 大きさ: 25 cm
• 分類:
  • LCC : TK7895.E42
  • DC22 : 004.2/56
• 件名:
  • LCSH : Embedded computer systems -- Testing
  • LCSH : Embedded computer systems -- Reliability
  • LCSH : Fault location (Engineering)
• 親書誌ID:
  • BA19587827