Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics-2003 : symposium held April 21-25, 2003, San Francisco, California, U.S.A.

Author(s)

    • Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics
    • McKerrow, Andrew J.
    • Leu, Jihperng (Jim)
    • Kraft, Oliver
    • Kikkawa, Takamaro

Bibliographic Information

Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics-2003 : symposium held April 21-25, 2003, San Francisco, California, U.S.A.

editors, Andrew J. McKerrow ... [et al.]

(Materials Research Society symposium proceedings, v. 766)

Materials Research Society, c2003

Available at  / 2 libraries

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Note

Includes bibliographical references and indexes

Related Books: 1-1 of 1

Details

  • NCID
    BA65639421
  • ISBN
    • 1558997032
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Warrendale, Pa.
  • Pages/Volumes
    xv, 515 p.
  • Size
    24 cm
  • Parent Bibliography ID
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