Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California

Author(s)

• IEEE International Workshop on Memory Technology, Design, and Testing
• Singh, Adit
• Wik, Thomas
• Rajsuman, Rochit
• IEEE Computer Society
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society. Technical Committee on VLSI
• IEEE Solid-State Circuits Society

Bibliographic Information

Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California

sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid State Circuits Society ; [edited by Tom Wik, Adit Singh, and Rochit Rajsuman]

IEEE Computer Society, c2003

Other Title

PR02004

MTDT 2003

Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing

Note

"IEEE Computer Society Order Number PR02004" -- T. p. verso

Includes bibliographical references and index

Description and Table of Contents

Description

"IEEE Computer Society Order Number PR02004"--T.p. verso.

by "Nielsen BookData"

Details

• NCID: BA65806250
• ISBN:
  • 0769520049
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: ix, 95 p.
• Size: 28 cm