Bibliographic Information

Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California

sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid State Circuits Society ; [edited by Tom Wik, Adit Singh, and Rochit Rajsuman]

IEEE Computer Society, c2003

Other Title

PR02004

MTDT 2003

Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing

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Note

"IEEE Computer Society Order Number PR02004" -- T. p. verso

Includes bibliographical references and index

Description and Table of Contents

Description

"IEEE Computer Society Order Number PR02004"--T.p. verso.

by "Nielsen BookData"

Details
  • NCID
    BA65806250
  • ISBN
    • 0769520049
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Los Alamitos, Calif.
  • Pages/Volumes
    ix, 95 p.
  • Size
    28 cm
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