Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA

著者

    • Hunt, Martin A.
    • Price, Jeffery R.
    • IS & T--the Society for Imaging Science and Technology
    • Society of Photo-optical Instrumentation Engineers

書誌事項

Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA

Martin A. Hunt, Jeffery R. Price, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 5011）

SPIE, c2003

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注記

Includes bibliographical references and index

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  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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