Ninteenth annual IEEE Semiconductor Thermal Measurement and Management Symposium, San Jose, CA USA, March 11-13, 2003 : SEMI-THRM Proceedings 2003

Author(s)

• IEEE Semiconductor Thermal Measurement and Management Symposium
• Institute of Electrical and Electronics Engineers
• Components, Packaging & Manufacturing Technology Society
• United States. National Institute of Standards and Technology

Bibliographic Information

Ninteenth annual IEEE Semiconductor Thermal Measurement and Management Symposium, San Jose, CA USA, March 11-13, 2003 : SEMI-THRM Proceedings 2003

[sponsored by] IEEE, Components, Packaging, and Manufacturing Technology Society, NIST

IEEE Service Center, c2003

Other Title

02CH37437

Note

Title from cover

"IEEE catalog number 02CH37437" -- T.p. verso

Symposium held at: Fiarmont Hotel, San Jose, CA, USA

Details

• NCID: BA65904158
• ISBN:
  • 0780377931
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, N.J.
• Pages/Volumes: xiii, 404 p.
• Size: 28 cm