GaAs IC Symposium : IEEE Gallium Arsenide Integrated Circuit Symposium : 25th Annual, Technical Digest 2003, San Diego, California, November 9-12,2003

著者

• IEEE Gallium Arsenide Integrated Circuit Symposium
• IEEE Electron Devices Society
• IEEE Microwave Theory and Techniques Society
• IEEE Solid-State Circuits Society

書誌事項

GaAs IC Symposium : IEEE Gallium Arsenide Integrated Circuit Symposium : 25th Annual, Technical Digest 2003, San Diego, California, November 9-12,2003

sponsored by the IEEE Electron Divices Society ; technically co-sponsored by the IEEE Microwave Theory and Techniques Society, and the IEEE Solid-State Circuits Society

IEEE Service Center, c2003

タイトル別名

03CH37445

注記

"IEEE catalog number 03CH37445" --on T.p. verso

Includes bibliographical references and index

内容説明・目次

内容説明

Covers topics including IC testing & methodology, packaging technology reliability, advanced device applications, system applications, and optoelectronics and OEIC applications.

目次

• Innovative RFIIC device & circuit concepts - circuit design & fabrication
• manufacturing technology & cost issues
• CAD/CAM/CAT tools & techniques
• IC testing & methodology
• packaging technology reliability
• advanced device applications
• system applications
• optoelectronics and OEIC applications.

「Nielsen BookData」 より

• NII書誌ID(NCID): BA65911404
• ISBN:
  • 0780378334
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, N.J.
• ページ数/冊数: 304 p.
• 大きさ: 28 cm