Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2002

Author(s)

• International Symposium on the Physical & Failure Analysis of Integrated Circuits
• Thong, John T. L.
• IEEE Singapore Section. Reliability/CPMT/EDA Chapter
• IEEE Electron Devices Society
• National University of Singapore. Centre for IC Failure Analysis and Reliability
• IEEE Reliability Society
• Tan, Wilson
• Chim, Wai Kin
• Lee, Kheng Chooi

Bibliographic Information

Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2002

edited by John Thong ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore

Institute of Electrical and Electronics Engineers, c2002

Other Title

9th International Symposium on th Physical & Failure Analysis of Integrated Circuits 2002

IPFA 2002 proceedings

2TH8614

Note

"IEEE catalog number 02TH8614"--T.p. verso

Includes bibliographical references and index

"8-12 July 2002, Raffles City Convention Centre, Singapore" in cover

Other editors : Wilson Tan, Chim Wai Kin, Lee Kheng Chooi

Details

• NCID: BA66217936
• ISBN:
  • 0780374169
• LCCN: 2002100970
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, N.J.
• Pages/Volumes: 258 p.
• Size: 30 cm