SAE residual stress measurement by x-ray diffraction
著者
書誌事項
SAE residual stress measurement by x-ray diffraction
（SAE international, HS-784）
SAE International, c2003
2003 ed
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Residual stress measurement by x-ray diffraction
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注記
Includes bibliographical references
内容説明・目次
内容説明
This editorial review of J784a is based upon decades of experience in the practical application of x-ray diffraction residual stress measurement methods in thousands of individual applications. J784 is a classic document. It serves as the only recognized standard for residual stress measurement available. The purpose of this revision is not to incorporate all of the research in the fields of x-ray and neutron diffraction but to focus on the practical applications of x-ray diffraction techniques useful to members of the automotive engineering related industries.
目次
- Section 1 - Residual Stresses - Types and Sources
- Section 2 - Principles of Residual Stress Management
- Section 3 - Equipment and methods of Analysis
- Section 4 - Instrumental Factors Affecting X-Ray Diffraction
- Chapter 5 - Specimen Preparation
- Chapter 6 - Control of Instrumental Factors
- Chapter 7 - Factors Influencing the Accuracy and Reproducibility of Residual Stress Measurements
- Section 8 - Residual Stress Standard Specimen.
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