Proceedings, 22nd IEEE VLSI Test Symposium : 25-29 April 2004, Napa Valley, California

Author(s)

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Council

Bibliographic Information

Proceedings, 22nd IEEE VLSI Test Symposium : 25-29 April 2004, Napa Valley, California

sponsored by IEEE Computer Society Test Technology Technical Council

IEEE Computer Society, c2004

Other Title

VTS04

Note

IEEE Computer Society order number: PR2134

Includes bibliographical references and index

Details

• NCID: BA67539723
• ISBN:
  • 0769521347
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xxvii, 406 p.
• Size: 28 cm
• Classification:
  • DC20 : 621.39/5/0287
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses