Testing static random access memories : defects, fault models, and test patterns

Author(s)

• Hamdioui, Said

Bibliographic Information

Testing static random access memories : defects, fault models, and test patterns

by Said Hamdioui

（Frontiers in electronic testing, 26）

Kluwer Academic, c2004

Note

Includes bibliographical references and index

Details

• NCID: BA67959580
• ISBN:
  • 1402077521
• LCCN: 2004041373
• Country Code: ne
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Boston
• Pages/Volumes: xx, 221 p.
• Size: 25 cm
• Classification:
  • LCC : TK7895.M4
  • DC22 : 004.5/3
• Subject Headings:
  • LCSH : Random access memory -- Testing
• Parent Bibliography ID:
  • BA19587827