Three-dimensional x-ray diffraction microscopy : mapping polycrystals and their dynamics
著者
書誌事項
Three-dimensional x-ray diffraction microscopy : mapping polycrystals and their dynamics
(Springer tracts in modern physics : Ergebnisse der exakten Naturwissenschaften / editor, G. Höhler, v. 205)
Springer, c2004
大学図書館所蔵 件 / 全13件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
Includes bibliographical references and index
内容説明・目次
内容説明
Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing.
The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
目次
Introduction.- Methods for Meso-scale Structural Characterization.- Geometric Principles.- GRAINDEX and Related Analysis.- Orientation Mapping.- Combining 3DXRD and Absorption Contrast Tomography.- Multi-grain Crystallography.- The 3DXRD Microscope.- Applications.- Alternative Approaches.- Concluding Remarks.
「Nielsen BookData」 より