Twentieth annual IEEE Semiconductor Thermal Measurement and Management Symposium, San Jose, CA USA, March 9-11, 2004 : proceedings 2004

著者

• IEEE Semiconductor Thermal Measurement and Management Symposium
• Institute of Electrical and Electronics Engineers
• Components, Packaging & Manufacturing Technology Society
• United States. National Institute of Standards and Technology

書誌事項

Twentieth annual IEEE Semiconductor Thermal Measurement and Management Symposium, San Jose, CA USA, March 9-11, 2004 : proceedings 2004

[sponsored by] IEEE, Components, Packaging, and Manufacturing Technology Society, NIST

IEEE Service Center, c2004

注記

Title from cover

"IEEE catalog number 04CH37545" -- T.p. verso

Symposium held at: Fiarmont Hotel, San Jose, CA, USA

詳細情報

• NII書誌ID(NCID): BA69519421
• ISBN:
  • 078038363X
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, N.J.
• ページ数/冊数: xiii, 313 p.
• 大きさ: 28 cm