Twentieth annual IEEE Semiconductor Thermal Measurement and Management Symposium, San Jose, CA USA, March 9-11, 2004 : proceedings 2004

Author(s)

• IEEE Semiconductor Thermal Measurement and Management Symposium
• Institute of Electrical and Electronics Engineers
• Components, Packaging & Manufacturing Technology Society
• United States. National Institute of Standards and Technology

Bibliographic Information

Twentieth annual IEEE Semiconductor Thermal Measurement and Management Symposium, San Jose, CA USA, March 9-11, 2004 : proceedings 2004

[sponsored by] IEEE, Components, Packaging, and Manufacturing Technology Society, NIST

IEEE Service Center, c2004

Note

Title from cover

"IEEE catalog number 04CH37545" -- T.p. verso

Symposium held at: Fiarmont Hotel, San Jose, CA, USA

Details

• NCID: BA69519421
• ISBN:
  • 078038363X
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, N.J.
• Pages/Volumes: xiii, 313 p.
• Size: 28 cm