Infrared ellipsometry on semiconductor layer structures : phonons, plasmons, and polaritons

Author(s)

    • Schubert, Mathias

Bibliographic Information

Infrared ellipsometry on semiconductor layer structures : phonons, plasmons, and polaritons

Mathias Schubert

（Springer tracts in modern physics : Ergebnisse der exakten Naturwissenschaften / editor, G. Höhler, v. 209 . Solid-state physics / editors, Andrei Ruckenstein, Peter Wölfle）

Springer, c2004

Available at  / 14 libraries

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Note

Includes bibliographical references at the end of each chapter

Includes index

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  • Springer tracts in modern physics : Ergebnisse der exakten Naturwissenschaften

    editor, G. Höhler

    Springer-Verlag 1965-

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    Available at 95 libraries

Details

  • NCID
    BA70013703
  • ISBN
    • 3540232494
  • LCCN
    2004113130
  • Country Code
    gw
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Berlin
  • Pages/Volumes
    xi, 193 p.
  • Size
    24 cm
  • Parent Bibliography ID
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