Proceedings, 12th Asian Test Symposium, ATS 2003, 16-19 November 2003, Xi'an, China

Author(s)

• Asian Test Symposium
• IEEE Computer Society. Test Technology Technical Council

Bibliographic Information

Proceedings, 12th Asian Test Symposium, ATS 2003, 16-19 November 2003, Xi'an, China

sponsored by Test Technology Technical Council of IEEE Computer Society ; in cooperation with Technical Committee on Fault Tolerant Computing of CCF National Natural Science Foundation of China (NSFC)

IEEE Computer Society, c2003

Other Title

Twelfth Asian Test Symposium (ATS 2003)

Note

"IEEE Computer Society Order Number PR01951"--T.p. verso

Includes bibliographical references and index

Details

• NCID: BA71441043
• ISBN:
  • 0769519512
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xxi, 517 p.
• Size: 28 cm