Proceedings, 12th Asian Test Symposium, ATS 2003, 16-19 November 2003, Xi'an, China

著者

• Asian Test Symposium
• IEEE Computer Society. Test Technology Technical Council

書誌事項

Proceedings, 12th Asian Test Symposium, ATS 2003, 16-19 November 2003, Xi'an, China

sponsored by Test Technology Technical Council of IEEE Computer Society ; in cooperation with Technical Committee on Fault Tolerant Computing of CCF National Natural Science Foundation of China (NSFC)

IEEE Computer Society, c2003

タイトル別名

Twelfth Asian Test Symposium (ATS 2003)

注記

"IEEE Computer Society Order Number PR01951"--T.p. verso

Includes bibliographical references and index

内容説明・目次

内容説明

Papers from a November 2003 symposium present the latest ideas in the field of testing, in areas including design for testability, enhanced delay testing and ATPG, test power, software testing, fault diagnosis, memory testing, SOC test, DFT synthesis, test scheduling, measurement, test economics, current test, test compaction, functional testing an

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詳細情報

• NII書誌ID(NCID): BA71441043
• ISBN:
  • 0769519512
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xxi, 517 p.
• 大きさ: 28 cm