2003 IEEE International Conference on Microelectronic Systems Education : proceedings : June 1-2, 2003, Anaheim, California, USA

著者

• IEEE International Conference on Microelectronic Systems Education
• IEEE Computer Society. Design Automation Technical Committee
• IEEE Computer Society. Test Technology Committee
• IEEE Computer Society. Technical Committee on VLSI

書誌事項

2003 IEEE International Conference on Microelectronic Systems Education : proceedings : June 1-2, 2003, Anaheim, California, USA

sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI

IEEE Computer Society, c2003

タイトル別名

2003 International Conference on Microelectronic Systems Education : MSE '03

注記

"IEEE Computer Society order number PR01973"--T.p. verso

Includes bibliographical references and index

内容説明・目次

内容説明

This volume contains the proceedings of the 2003 IEEE International Conference on Microelectronics Systems Education (MSE 2003).

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA71472739
• ISBN:
  • 0769519733
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xii, 159 p.
• 大きさ: 28 cm