Autotestcon 2004 proceedings : IEEE Systems Readiness Technology Conference : technology and tradition unite in San Antonio

著者

• Autotestcon
• IEEE Aerospace and Electronic Systems Society
• IEEE Instrumentation and Measurement Society
• IEEE Central Texas Council

書誌事項

Autotestcon 2004 proceedings : IEEE Systems Readiness Technology Conference : technology and tradition unite in San Antonio

sponsors, IEEE Aerospace and Electronic Systems Society, IEEE Instrumentation and Measurement Society, IEEE Central Texas Council

Institute of Electrical and Electronic Engineers, c2004

タイトル別名

04CH37560

注記

"IEEE catalog number: 04CH37560"--T.p.

"San Antonio, TX, 20-23 September 2004"--Cover

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA72215822
• ISBN:
  • 0780384490
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Piscataway, N.J.]
• ページ数/冊数: xxxiv, 613 p.
• 大きさ: 28 cm