Embedded processor-based self-test

Author(s)

    • Gizopoulos, Dimitris
    • Paschalis, Antonis
    • Zorian, Yervant

Bibliographic Information

Embedded processor-based self-test

by Dimitris Gizopoulos, Antonis Paschalis and Yervant Zorian

（Frontiers in electronic testing, 28）

Kluwer Academic, c2004

Available at  / 2 libraries

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Note

Includes bibliographical references (p.[197]-212) and index

Related Books： 1-1 of 1

Details

  • NCID
    BA72886191
  • ISBN
    • 1402027850
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Boston
  • Pages/Volumes
    xiv, 216 p.
  • Size
    25 cm
  • Parent Bibliography ID
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