Electron microprobe analysis and scanning electron microscopy in geology
著者
書誌事項
Electron microprobe analysis and scanning electron microscopy in geology
Cambridge University Press, c2005
2nd ed
- : hard
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注記
Includes bibliographical references (p. 182-189) and index
内容説明・目次
内容説明
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
目次
- Preface
- Acknowledgements
- 1. Introduction
- 2. Electron-specimen interactions
- 3. Instrumentation
- 4. Scanning electron microscopy
- 5. X-ray spectrometers
- 6. Element mapping
- 7. X-ray analysis (1)
- 8. X-ray analysis (2)
- 9. Sample preparation
- Appendix
- References
- Index.
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