Proceedings : 23rd IEEE VLSI Test Symposium : 1-5 May, 2005, Palm Springs, California

著者

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Council

書誌事項

Proceedings : 23rd IEEE VLSI Test Symposium : 1-5 May, 2005, Palm Springs, California

sponsored by IEEE Computer Society Test Technology Technical Council (TTTC)

IEEE Computer Society, c2005

タイトル別名

VTS 2005

VLSI Test Symposium

注記

"IEEE Computer Society Order Number P2314"--T.p. verso

Includes bibliographical references and author index

http://ieeexplore.ieee.org/servlet/opac?punumber=9857

詳細情報

• NII書誌ID(NCID): BA73779302
• ISBN:
  • 0769523145
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xxv, 455 p.
• 大きさ: 28 cm
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses