Proceedings : 23rd IEEE VLSI Test Symposium : 1-5 May, 2005, Palm Springs, California

Author(s)

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Council

Bibliographic Information

Proceedings : 23rd IEEE VLSI Test Symposium : 1-5 May, 2005, Palm Springs, California

sponsored by IEEE Computer Society Test Technology Technical Council (TTTC)

IEEE Computer Society, c2005

Other Title

VTS 2005

VLSI Test Symposium

Note

"IEEE Computer Society Order Number P2314"--T.p. verso

Includes bibliographical references and author index

http://ieeexplore.ieee.org/servlet/opac?punumber=9857

Details

• NCID: BA73779302
• ISBN:
  • 0769523145
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xxv, 455 p.
• Size: 28 cm
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses