Electron energy loss spectroscopy

書誌事項

Electron energy loss spectroscopy

Rik Brydson

(Microscopy handbooks, 48)

Bios in association with the Royal Microscopical Society, 2001

  • : [pbk.]

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注記

Includes bibliographical references and index

内容説明・目次

内容説明

Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the principles and applications of EELS. Specific topics covered include, theory of EELS, elemental quantification, EELS fine structure, EELS imaging and advanced techniques.

目次

Abbreviations -- Preface -- Acknowledgements -- 1. Introduction -- What is EELS? -- Interaction of electrons with matter -- Basics of the TEM -- Comparison of EELS in TEM with other spectroscopies -- Conclusions -- References -- 2. The EEL spectrum -- The primary transmitted electron signal -- Historical development -- Basic components of an EEL spectrum -- Basic physics -- Summary of analytical uses -- References -- 3. EELS instrumentation and experimental aspects -- The electron spectrometer -- Coupling a magnetic spectrometer to the microscope -- Spectral recording -- Energy-filtered imaging -- Choice of experimental conditions for EELS -- Specimen parameters -- Summary of experimental set-up and data acquisition procedures for EELS -- Summary of data correction procedures for EELS -- References and further reading -- 4. Low loss spectroscopy -- Quantification of sample thickness -- Quantitative aspects of low loss data -- Experimental aspects of EELS low loss measurements -- Conclusions -- References and further reading -- 5. Elemental quantification -- Quantification of EEL spectra -- Background removal -- Determination of the ionization cross-section -- Final quantification step -- Summary of the quantification procedure -- Summary of experimental quantification parameters -- Accuracy and detection sensitivity of EELS quantification and comparison with EDX in the TEM -- References and further reading -- 6. Fine structure on inner-shell ionization edges (ELNESIEXELFS) -- Origin of edge fine structure -- Determination of coordinations -- Determination of valencies -- Determination of bond lengths -- Experimental aspects of ELNESIEXELFS measurements -- Conclusions -- References and further reading -- 7. EELS imaging -- Introduction to EELS imaging and energy filtering -- Summary of energy-filtering techniques -- Procedure for EFTEM elemental mapping -- Experimental parameters in EFTEM -- Correlation of elemental maps -- General strategy for EFTEM elemental analysis -- Experimental procedure for EFTEM image acquisition and processing -- Comparison of EFTEM and spectrum imaging methods -- Energy-filtered tomography -- Conclusions -- References and further reading -- 8. Advanced EELS techniques in the TEM -- Orientation dependency in EELS -- Spatially resolved measurements -- Electron Compton scattering -- Reflection mode and surface measurements -- References and further reading -- 9. Conclusions -- Further reading -- Further resources -- Index.

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詳細情報

  • NII書誌ID(NCID)
    BA75683011
  • ISBN
    • 1859961347
  • 出版国コード
    uk
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Oxford
  • ページ数/冊数
    xii, 137 p
  • 大きさ
    24 cm
  • 分類
  • 件名
  • 親書誌ID
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