Hardware and software verification and testing : First International Haifa Verification Conference, Haifa, Israel, November 13-16, 2005. revised selected papers

著者

• International Haifa Verification Conference
• Ur, Shmuel
• Bin, Eyal
• Wolfsthal, Yaron

書誌事項

Hardware and software verification and testing : First International Haifa Verification Conference, Haifa, Israel, November 13-16, 2005. revised selected papers

Shmuel Ur, Eyal Bin, Yaron Wolfsthal (eds.)

（Lecture notes in computer science, 3875）

Springer Berlin, c2006

詳細情報

• NII書誌ID(NCID): BA7674428X
• ISBN:
  • 3540326049
• LCCN: 2006921186
• 出版国コード: gw
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Berlin
• ページ数/冊数: x, 264 p.
• 大きさ: 24 cm
• 分類:
  • SG : 004
• 親書誌ID:
  • BA00009279