Records of the 2004 International Workshop on Memory Technology, Design and Testing : MTDT 2004 : 9-10 August, 2004, San Jose, California, USA

著者

• IEEE International Workshop on Memory Technology, Design, and Testing
• Rajsuman, Rochit
• Wik, T. (Thomas)
• IEEE Computer Society
• IEEE Computer Society. Technical Committee on VLSI
• IEEE Computer Society. Test Technology Technical Council
• IEEE Solid-State Circuits Society

書誌事項

Records of the 2004 International Workshop on Memory Technology, Design and Testing : MTDT 2004 : 9-10 August, 2004, San Jose, California, USA

edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society

IEEE Computer Society, c2004

タイトル別名

Records of the 2004 IEEE International Workshop on Memory Technology, Design and Testing

注記

"IEEE Computer Society Order Number P2193"--T.p. verso

Workshop number from Web site

Includes bibliographical references and author index

詳細情報

• NII書誌ID(NCID): BA77205735
• ISBN:
  • 0769521932
• LCCN: 2005295655
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: vii, 121 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7895.M4
  • DC22 : 621.39/732
• 件名:
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Random access memory -- Congresses