Records of the 2004 International Workshop on Memory Technology, Design and Testing : MTDT 2004 : 9-10 August, 2004, San Jose, California, USA

Author(s)

• IEEE International Workshop on Memory Technology, Design, and Testing
• Rajsuman, Rochit
• Wik, T. (Thomas)
• IEEE Computer Society
• IEEE Computer Society. Technical Committee on VLSI
• IEEE Computer Society. Test Technology Technical Council
• IEEE Solid-State Circuits Society

Bibliographic Information

Records of the 2004 International Workshop on Memory Technology, Design and Testing : MTDT 2004 : 9-10 August, 2004, San Jose, California, USA

edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society

IEEE Computer Society, c2004

Other Title

Records of the 2004 IEEE International Workshop on Memory Technology, Design and Testing

Note

"IEEE Computer Society Order Number P2193"--T.p. verso

Workshop number from Web site

Includes bibliographical references and author index

Details

• NCID: BA77205735
• ISBN:
  • 0769521932
• LCCN: 2005295655
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: vii, 121 p.
• Size: 28 cm
• Classification:
  • LCC : TK7895.M4
  • DC22 : 621.39/732
• Subject Headings:
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Random access memory -- Congresses