Proceedings, 13th Asian Test Symposium : Kenting, Taiwan, November 15-17, 2004

著者

• Asian Test Symposium
• IEEE Computer Society. Test Technology Technical Council
• Kuo li chʿing hua ta hsüeh (Hsin-chu shih, Taiwan)

書誌事項

Proceedings, 13th Asian Test Symposium : Kenting, Taiwan, November 15-17, 2004

[sponsored by IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua University]

IEEE Computer Society, c2004

タイトル別名

ATS'04

Asian Test Symposium (ATS 2004)

注記

"ATS'04"--Half t.p.

"IEEE Computer Society Order Number P2235"--T.p. verso

Includes bibliographical references and author index

詳細情報

• NII書誌ID(NCID): BA77234642
• ISBN:
  • 0769522351
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xxvi, 465 p.
• 大きさ: 27 cm.
• 付属資料: 1 CD-ROM
• 件名:
  • LCSH : Electronic digital computers -- Circuits -- Testing -- Congresses
  • LCSH : Electronic circuits -- Testing -- Congresses
  • LCSH : Fault-tolerant computing -- Congresses
• リンク:
  • ieeexplore.ieee.org/servlet/opac?punumber=9468