VLSI test principles and architectures : design for testability

著者

• Wang, Laung-Terng
• Wu, Cheng-Wen, EE Ph. D.
• Wen, Xiaoqing

書誌事項

VLSI test principles and architectures : design for testability

edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

（The Morgan Kaufmann series in systems on silicon / Peter J. Ashenden, Wayne Wolf, series editors）

Elsevier Morgan Kaufmann Publishers, 2006

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BA77850034
• ISBN:
  • 9780123705976
• LCCN: 2006006869
• 出版国コード: ne
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Amsterdam
• ページ数/冊数: xxx, 777 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TK7874.75
  • DC22 : 621.39/5
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing
  • LCSH : Integrated circuits -- Very large scale integration -- Design
• 親書誌ID:
  • BA52674984