Proceedings : 24th IEEE VLSI Test Symposium : April 30-May 4, 2006, Berkeley, California

著者

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Council

書誌事項

Proceedings : 24th IEEE VLSI Test Symposium : April 30-May 4, 2006, Berkeley, California

sponsored by IEEE Computer Society Test Technology Technical Council

IEEE Computer Society, c2006

タイトル別名

24th IEEE VLSI Test Symposium : proceedings : April 30-May 4, 2006, Berkeley, California

VTS06

VLSI Test Symposium

注記

"IEEE Computer Society Order Number P2514"--T.p. verso

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA78130595
• ISBN:
  • 0769525148
• LCCN: 2006923027
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xxix, 428 p.
• 大きさ: 28 cm.
• 付属資料: 1 compact disc
• 分類:
  • LCC : TK7874
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses