Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, proceedings

著者

• Yeung, Dit-Yan
• Kwok, James T.
• Fred, Ana
• Roli, Fabio
• Ridder, Dick de
• International Association for Pattern Recognition
• International Workshop on Structural and Syntactic Pattern Recognition
• International Workshop on Statistical Techniques in Pattern Recognition

書誌事項

Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, proceedings

ed. Dit-Yan Yeung, James T. Kwok, Ana Fred ...[et al.]

（Lecture notes in computer science, 4109）

Springer, 2006

注記

"S+SSPR 2006, IAPR"

Includes bibliographical reference and index

詳細情報

• NII書誌ID(NCID): BA7820491X
• ISBN:
  • 3540372369
• LCCN: 2006930416
• 出版国コード: gw
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Berlin
• ページ数/冊数: xxi, 939 p.
• 大きさ: 24 cm
• 親書誌ID:
  • BA00009279