Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, proceedings

Author(s)

• Yeung, Dit-Yan
• Kwok, James T.
• Fred, Ana
• Roli, Fabio
• Ridder, Dick de
• International Association for Pattern Recognition
• International Workshop on Structural and Syntactic Pattern Recognition
• International Workshop on Statistical Techniques in Pattern Recognition

Bibliographic Information

Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, proceedings

ed. Dit-Yan Yeung, James T. Kwok, Ana Fred ...[et al.]

（Lecture notes in computer science, 4109）

Springer, 2006

Note

"S+SSPR 2006, IAPR"

Includes bibliographical reference and index

Details

• NCID: BA7820491X
• ISBN:
  • 3540372369
• LCCN: 2006930416
• Country Code: gw
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Berlin
• Pages/Volumes: xxi, 939 p.
• Size: 24 cm
• Parent Bibliography ID:
  • BA00009279