Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2005 : [27 June to 1 July 2005, Shangri-La's rasa Sentosa Resort, Singapore]

著者

• International Symposium on the Physical & Failure Analysis of Integrated Circuits
• Tung, Chih-Hang
• IEEE Reliability/CPMT/ED Singapore Chapter
• IEEE Electron Devices Society
• Centre for IC Failure Anlaysis & Reliability (CICFAR)
• National University of Singapore

書誌事項

Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2005 : [27 June to 1 July 2005, Shangri-La's rasa Sentosa Resort, Singapore]

edited by Tung Chih-Hang ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapoer Chapter ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with Centre for IC Failure Anlaysis & Reliability (CICFAR), National University of Singapore

IEEE, c2005

タイトル別名

05TH8827

注記

"IEEE Catalog Number 05TH8827"--T.p. verso

Includes bibliographical references and authors index

詳細情報

• NII書誌ID(NCID): BA78343778
• ISBN:
  • 0780393015
• LCCN: 2006276365
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, N.J.
• ページ数/冊数: 213 p.
• 大きさ: 30 cm
• 分類:
  • LCC : TK7874
  • DC22 : 621.3815028/7
• 件名:
  • LCSH : Integrated circuits -- Defects -- Congresses
  • LCSH : Integrated circuits -- Testing -- Congresses
• リンク:
  • ieeexplore.ieee.org/servlet/opac?punumber=9910