Oscillation-based test in mixed-signal circuits
Author(s)
Bibliographic Information
Oscillation-based test in mixed-signal circuits
(Frontiers in electronic testing, 36)
Springer, c2006
Available at 2 libraries
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Note
Bibliography: p. 439-452
Description and Table of Contents
Description
This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test - OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
Table of Contents
1 Oscillation-Based Test Methodology. 1.1. Linking Oscillation with Testing: OBT Methodology. 1.2. The OBT oscillator. 1.3. The OBT concept revisited: proposal for robust OBT. 1.4. Conclusions: summarizing the new OBT concept. 2 Mathematical Review of Non-linear Oscillators. 2.1. Framework. 2.2. The Describing Function Method. 2.3. Applying the DF approach. 2.4. Error bound calculation for the DF approach. 2.5. Summary. 3 OBT Methodology for Discrete-Time Filters. 3.1. Feasible OBT strategy in discrete-time filters. 3.2. Application to a particular biquad structure. 3.3. Towards a general OBT biquad structure: Generic Oscillator. 3.4. Summary. 4 OBT Methodology for Modulators. 4.1. OBT Concept in Low-pass discrete-time SD modulators. 4.2. OBT Concept in Bandpass discrete-time SD modulators. 4.3. Practical OBT scheme for any type of modulators. 4.4. Summary. 5 OBT Implementation in Discrete-Time Filters. 5.1. A specific circuit. 5.2. Some practical examples. 5.3. Fault coverage considerations. 5.4. Oscillator Modelling Accuracy. 5.5. DTMF Biquad Validation. 5.6. Summary. 6 Practical considerations for OBT-OBIST application. 6.1. Applying the OBT-OBIST Methodology to the DTMF Macrocell. 6.2. On-chip evaluation of OBT output signals. 6.3. Electrical Simulation Results in the BIST Mode. 6.4. Digital Processing Part of the DTMF. 6.5. DTMF/OBIST operation modes description. 6.6. Summary. 7 OBT/OBIST silicon validation. 7.1. Introduction. 7.2. First Experimental Circuit Demonstrator. 7.3. Second Circuit Demonstrator: DTMF receiver. 7.4. Summary. Appendices. Conclusions. References.
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