Advanced sensor technologies for nondestructive evaluation and structural health monitoring II : 1-2 March 2006, San Diego, California, USA

Author(s)

    • Meyendorf, Norbert
    • Baaklini, George Y.
    • Michel, Bernd

Bibliographic Information

Advanced sensor technologies for nondestructive evaluation and structural health monitoring II : 1-2 March 2006, San Diego, California, USA

Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by ASME--American Society of Mechanical Engineers (USA) ; cooperating organizations, Intelligent Materials Forum (Japan), Jet Propulsion Laboratory (USA), [and] National Science Foundation (USA)

(Proceedings / SPIE -- the International Society for Optical Engineering, v. 6179)

SPIE, c2006

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Includes bibliographical references and author index

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Description

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

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