Advanced sensor technologies for nondestructive evaluation and structural health monitoring II : 1-2 March 2006, San Diego, California, USA

著者

• Meyendorf, Norbert
• Baaklini, George Y.
• Michel, Bernd

書誌事項

Advanced sensor technologies for nondestructive evaluation and structural health monitoring II : 1-2 March 2006, San Diego, California, USA

Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by ASME--American Society of Mechanical Engineers (USA) ; cooperating organizations, Intelligent Materials Forum (Japan), Jet Propulsion Laboratory (USA), [and] National Science Foundation (USA)

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 6179）

SPIE, c2006

注記

Includes bibliographical references and author index

内容説明・目次

内容説明

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

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詳細情報

• NII書誌ID(NCID): BA79770399
• ISBN:
  • 0819462322
• LCCN: 2006298977
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: 1 v. (various pagings)
• 大きさ: 28 cm
• 分類:
  • LCC : TA645
• 件名:
  • LCSH : Structural analysis (Engineering) -- Congresses
  • LCSH : Detectors -- Congresses
  • LCSH : Automatic data collection systems -- Congresses
  • LCSH : Nondestructive testing -- Congresses
• 親書誌ID:
  • BA0022700X