Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA
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Bibliographic Information
Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA
（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4779）
SPIE, c2002
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Includes index
Description and Table of Contents
Description
This new edition takes into account advances in software and technology such as interactive whiteboards and digital cameras, focusing upon how these new resources can be most effectively used to enhance teaching and learning in the classroom.
by "Nielsen BookData"
