Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA

著者

• Duparré, Angela
• Singh, Bhanwar
• Society of Photo-optical Instrumentation Engineers

書誌事項

Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA

Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations the Boeing Company (USA) ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4779）

SPIE, c2002

注記

Includes index

内容説明・目次

内容説明

This new edition takes into account advances in software and technology such as interactive whiteboards and digital cameras, focusing upon how these new resources can be most effectively used to enhance teaching and learning in the classroom.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA80159283
• ISBN:
  • 0819445460
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: viii, 192 p.
• 大きさ: 28 cm
• 親書誌ID:
  • BA0022700X