Advanced gate stack, source/drain and channel engineering for Si-based CMOS 2: new materials, processes, and equipment

Bibliographic Information

Advanced gate stack, source/drain and channel engineering for Si-based CMOS 2: new materials, processes, and equipment

editors, F. Rooozeboom ... [et al.] ; sponsoring divisions, Electronics and Photonics, Dielectric Science & Technology, High Temperature Materials

(ECS transactions, vol. 3, no. 2)

Electrochemical Society, c2006

Available at  / 2 libraries

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Note

Includes bibliographical references and indexes

"The international symposium on Advanced Gate Stack, Source/Drain and Channel Engineering for Si-based CMOS: New Materials, Processes, and Equipment, 2 will be held from October 30-November 2, 2006 in the Moon Palace in the scenic city of Cancun, Mexico, as a part of the 210th Meeting of the Electrochemical Society. ..."--p. iii

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Details

  • NCID
    BA80737007
  • ISBN
    • 1566775027
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Pennington, NJ
  • Pages/Volumes
    ix, 460 p.
  • Size
    23 cm
  • Parent Bibliography ID
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