Proceedings : 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 4-6 October, 2006, Arlington, Virginia, USA

書誌事項

Proceedings : 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 4-6 October, 2006, Arlington, Virginia, USA

edited by Nohpill Park ... [et al.] ; sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), the IEEE Computer Society Technical Committee on Fault-Tolerant Computing(TCFTC)

IEEE Computer Society, c2006

タイトル別名

DPT2006

International Symposium on Defect and Fault Tolerance in VLSI Systems

Defect and fault tolerance in VLSI systems

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注記

IEEE Computer Society Order Number P2706

Includes bibliographical references and author index

詳細情報

  • NII書誌ID(NCID)
    BA81902404
  • ISBN
    • 9780769527062
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Los Alamitos, Calif.
  • ページ数/冊数
    xii, 583 p.
  • 大きさ
    23 cm
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