Proceedings : 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 4-6 October, 2006, Arlington, Virginia, USA

著者

• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
• Park, Nohpill
• IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
• IEEE Computer Society. Test Technology Technical Council

書誌事項

Proceedings : 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 4-6 October, 2006, Arlington, Virginia, USA

edited by Nohpill Park ... [et al.] ; sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), the IEEE Computer Society Technical Committee on Fault-Tolerant Computing(TCFTC)

IEEE Computer Society, c2006

タイトル別名

DPT2006

International Symposium on Defect and Fault Tolerance in VLSI Systems

Defect and fault tolerance in VLSI systems

注記

IEEE Computer Society Order Number P2706

Includes bibliographical references and author index

詳細情報

• NII書誌ID(NCID): BA81902404
• ISBN:
  • 9780769527062
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xii, 583 p.
• 大きさ: 23 cm