The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984

著者

• International Test Conference
• IEEE Computer Society. Test Technology Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984

sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section

IEEE Computer Society Press, c1984

• pbk.
• microfiche
• hard

タイトル別名

IEEE 1984 Test Conference

注記

"IEEE catalog no. 84CH2084-2."

"Computer Society order no. 548."

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA82230414
• ISBN:
  • 0818605480
  • 0818645482
  • 0818685484
• LCCN: 84081879
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Silver Spring, MD
• ページ数/冊数: xxxi, 886 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC19 : 621.381/73/0287
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Semiconductors -- Testing -- Congresses