The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984

Author(s)

• International Test Conference
• IEEE Computer Society. Test Technology Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984

sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section

IEEE Computer Society Press, c1984

• pbk.
• microfiche
• hard

Other Title

IEEE 1984 Test Conference

Note

"IEEE catalog no. 84CH2084-2."

"Computer Society order no. 548."

Includes bibliographical references and index

Details

• NCID: BA82230414
• ISBN:
  • 0818605480
  • 0818645482
  • 0818685484
• LCCN: 84081879
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Silver Spring, MD
• Pages/Volumes: xxxi, 886 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC19 : 621.381/73/0287
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Semiconductors -- Testing -- Congresses