The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984

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書誌事項

The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984

sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section

IEEE Computer Society Press, c1984

  • pbk.
  • microfiche
  • hard

タイトル別名

IEEE 1984 Test Conference

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注記

"IEEE catalog no. 84CH2084-2."

"Computer Society order no. 548."

Includes bibliographical references and index

内容説明・目次

内容説明

Topics in these papers on intelligence and systems include: intelligence in neural and biological systems track; evolutionary computation; cognitive science and computational applications; and analysis of biological systems.

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