Advanced gate stack, source/drain and channel engineering for Si-based CMOS 3 : new materials, processes and equipment

Bibliographic Information

Advanced gate stack, source/drain and channel engineering for Si-based CMOS 3 : new materials, processes and equipment

editors, M. C. Öztürk ... [et al.] ; sponsoring divisions, Electronics and Photonics, Dielectric Science & Technology, High Temperature Materials

(ECS transactions, vol. 6, no. 1)

Electrochemical Society, c2007

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Note

Includes bibliographical references and indexes

"The international symposium on Advanced Gate Stack, Source/Drain and Channel Engineering for Si-based CMOS: New Materials, Prosesses and Equipment, 3 will be held in May 6-10, 2007 in Chicago, the financial, business, and cultural capital of the Midwest as a part of the 211th Meeting of the Electrochemical Society" -- iii p.

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Details

  • NCID
    BA82338002
  • ISBN
    • 9781566775502
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Pennington, NJ
  • Pages/Volumes
    x, 470 p.
  • Size
    23 cm
  • Parent Bibliography ID
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