Proceedings : 25th IEEE VLSI Test Symposium : 6-10 May, 2007, Berkeley, California

Author(s)

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Council

Bibliographic Information

Proceedings : 25th IEEE VLSI Test Symposium : 6-10 May, 2007, Berkeley, California

[sponsored by IEEE Computer Society Test Technology Technical Council]

IEEE Computer Society, c2007

Other Title

25th IEEE VLSI Test Symposium : proceedings : May 46-10, 2007, Berkeley, California

VTS07

VLSI Test Symposium

Note

"IEEE Computer Society Order Number P2812"--T.p. verso

Includes bibliographical references and index

Details

• NCID: BA82718998
• ISBN:
  • 9780769528120
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xxx, 484 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses