Defect-oriented testing for nano-metric CMOS VLSI circuits

Author(s)

• Sachdev, Manoj
• Pineda de Gyvez, José

Bibliographic Information

Defect-oriented testing for nano-metric CMOS VLSI circuits

by Manoj Sachdev and José Pineda de Gyvez

（Frontiers in electronic testing, 34）

Springer, c2007

2nd ed.

Note

Includes bibliographical references and index

• NCID: BA83565054
• ISBN:
  • 9780387465463
• Country Code: ne
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Dordrecht
• Pages/Volumes: xxi, 328 p.
• Size: 25 cm
• Classification:
  • SG : 620
• Parent Bibliography ID:
  • BA19587827