Advanced tomographic methods in materials research and engineering

著者

• Banhart, John

書誌事項

Advanced tomographic methods in materials research and engineering

edited by John Banhart

（Monographs on the physics and chemistry of materials）

Oxford University Press, 2008

• : [hardback]

注記

Some copies issued without CD-ROM

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA85495437
• ISBN:
  • 9780199213245
• LCCN: 2008295651
• 出版国コード: uk
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Oxford
• ページ数/冊数: xxv, 462 p., [4] p. of plates
• 大きさ: 25 cm.
• 付属資料: 1 CD-ROM
• 分類:
  • LCC : TA417.2
  • DC22 : 620.11272
• 件名:
  • LCSH : Materials -- Research
  • LCSH : Tomography -- Industrial applications
  • LCSH : Nondestructive testing
• 親書誌ID:
  • BA00306241