Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore

著者

• Automatic inspection and novel instrumentation
• Ho, Anthony Tung-Shuen
• Rao, Sreenivas
• Cheng, Lee Ming
• Society of Photo-optical Instrumentation Engineers
• Society of Photo-optical Instrumentation Engineers. Singapore Chapter
• Institute of Physics, Singapore

書誌事項

Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore

Anthony Tung-Shuen Ho, Sreenivas Rao, Lee Ming Cheng, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SPIE Singapore Chapter, [and] Institute of Physics Singapore ; cosponsored by SPIE Japan Chapter ... [et al.] ; cooperating organizations, Nanyang Technological University (Singapore) ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3185）

SPIE, c1997

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA85952302
• ISBN:
  • 0819426121
• LCCN: 98122013
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: vii, 170 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TS156.2
  • DC21 : 670.42/5
• 件名:
  • LCSH : Engineering inspection -- Automation -- Congresses
  • LCSH : Quality control -- Optical methods -- Congresses
  • LCSH : Optical detectors -- Industrial applications -- Congresses
  • LCSH : Imaging systems -- Industrial applications -- Congresses
• 親書誌ID:
  • BA0022700X