Proceedings : fourth IEEE International Symposium on Electronic Design, Test, and Applications, 23-25 January 2008, Hong Kong, SAR, China

Author(s)

• IEEE International Symposium on Electronic Design, Test and Applications
• Osseiran, Adam
• IEEE Computer Society. Test Technology Technical Council

Bibliographic Information

Proceedings : fourth IEEE International Symposium on Electronic Design, Test, and Applications, 23-25 January 2008, Hong Kong, SAR, China

editors, Adam Osseiran ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Hong Kong ED/SSC Joint Chapter, Hong Kong University of Science and Technology

IEEE Computer Society, c2008

Other Title

Fourth IEEE International Workshop on Electronic Design, Test, and Applications

Note

Includes bibliographical references and index

Details

• NCID: BA86085554
• ISBN:
  • 9780769531106
• LCCN: 2007941926
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xxi, 610 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC22 : 621.381
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Integrated circuits -- Design and construction -- Congresses
  • LCSH : Microelectronics -- Design -- Congresses
  • LCSH : Microelectronics -- Testing -- Congresses