CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test

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CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test

Andrei Pavlov, Manoj Sachdev

(Frontiers in electronic testing, 40)

Springer, c2008

Available at  / 5 libraries

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Includes bibliographical references (p. 183-189) and index

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