Proceedings : 26th IEEE VLSI Test Symposium : San Diego, California, 27 April-1 May 2008

Bibliographic Information

Proceedings : 26th IEEE VLSI Test Symposium : San Diego, California, 27 April-1 May 2008

IEEE Computer Society, c2008

Other Title

26th IEEE VLSI Test Symposium : VTS 2008 : San Diego, California, 27 April-1 May 2008

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"IEEE Computer Society Order Number P3123"--T.p. verso

Includes bibliographical references and index

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