A new world of scanning electron microscopy
Author(s)
Bibliographic Information
A new world of scanning electron microscopy
Nikkan Kogyo Shinbun, 2008
- Other Title
-
SEMの新しい世界
Available at 15 libraries
  Aomori
  Iwate
  Miyagi
  Akita
  Yamagata
  Fukushima
  Ibaraki
  Tochigi
  Gunma
  Saitama
  Chiba
  Tokyo
  Kanagawa
  Niigata
  Toyama
  Ishikawa
  Fukui
  Yamanashi
  Nagano
  Gifu
  Shizuoka
  Aichi
  Mie
  Shiga
  Kyoto
  Osaka
  Hyogo
  Nara
  Wakayama
  Tottori
  Shimane
  Okayama
  Hiroshima
  Yamaguchi
  Tokushima
  Kagawa
  Ehime
  Kochi
  Fukuoka
  Saga
  Nagasaki
  Kumamoto
  Oita
  Miyazaki
  Kagoshima
  Okinawa
  Korea
  China
  Thailand
  United Kingdom
  Germany
  Switzerland
  France
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  United States of America
Description and Table of Contents
Table of Contents
- Lateral resolution in in‐lens SE and high angle BSE imaging at low accelerating voltages, below 2.0kV
- Z‐contrast sensitivity in low‐voltage,high angle BSE imaging
- Information depth in low‐voltage,high angle BSE imaging
- Nano inclusions in Co‐hardened gold plating for electronic applications—further evidence for high lateral resolution in low‐voltage,high angle BSE imaging
- A thin layer of organic contaminant on the surface of mirror‐polished Al based hard disks
- A further potential of ultra‐low‐voltage in‐lens SE imaging
- Sample surface preparation by ultramicrotomy using a diamond knife for cross‐sectional examination of various coatings on metals
- Cross‐sectional examination of a galvanized steel
- Cross‐sectional examination of a painted steel
- Cross‐sectional examination of solder joint of a printed circuit board〔ほか〕
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