A new world of scanning electron microscopy
Author(s)
Bibliographic Information
A new world of scanning electron microscopy
Nikkan Kogyo Shinbun, 2008
- Other Title
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SEMの新しい世界
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Description and Table of Contents
Table of Contents
- Ｌａｔｅｒａｌ ｒｅｓｏｌｕｔｉｏｎ ｉｎ ｉｎ‐ｌｅｎｓ ＳＥ ａｎｄ ｈｉｇｈ ａｎｇｌｅ ＢＳＥ ｉｍａｇｉｎｇ ａｔ ｌｏｗ ａｃｃｅｌｅｒａｔｉｎｇ ｖｏｌｔａｇｅｓ， ｂｅｌｏｗ ２．０ｋＶ
- Ｚ‐ｃｏｎｔｒａｓｔ ｓｅｎｓｉｔｉｖｉｔｙ ｉｎ ｌｏｗ‐ｖｏｌｔａｇｅ，ｈｉｇｈ ａｎｇｌｅ ＢＳＥ ｉｍａｇｉｎｇ
- Ｉｎｆｏｒｍａｔｉｏｎ ｄｅｐｔｈ ｉｎ ｌｏｗ‐ｖｏｌｔａｇｅ，ｈｉｇｈ ａｎｇｌｅ ＢＳＥ ｉｍａｇｉｎｇ
- Ｎａｎｏ ｉｎｃｌｕｓｉｏｎｓ ｉｎ Ｃｏ‐ｈａｒｄｅｎｅｄ ｇｏｌｄ ｐｌａｔｉｎｇ ｆｏｒ ｅｌｅｃｔｒｏｎｉｃ ａｐｐｌｉｃａｔｉｏｎｓ—ｆｕｒｔｈｅｒ ｅｖｉｄｅｎｃｅ ｆｏｒ ｈｉｇｈ ｌａｔｅｒａｌ ｒｅｓｏｌｕｔｉｏｎ ｉｎ ｌｏｗ‐ｖｏｌｔａｇｅ，ｈｉｇｈ ａｎｇｌｅ ＢＳＥ ｉｍａｇｉｎｇ
- Ａ ｔｈｉｎ ｌａｙｅｒ ｏｆ ｏｒｇａｎｉｃ ｃｏｎｔａｍｉｎａｎｔ ｏｎ ｔｈｅ ｓｕｒｆａｃｅ ｏｆ ｍｉｒｒｏｒ‐ｐｏｌｉｓｈｅｄ Ａｌ ｂａｓｅｄ ｈａｒｄ ｄｉｓｋｓ
- Ａ ｆｕｒｔｈｅｒ ｐｏｔｅｎｔｉａｌ ｏｆ ｕｌｔｒａ‐ｌｏｗ‐ｖｏｌｔａｇｅ ｉｎ‐ｌｅｎｓ ＳＥ ｉｍａｇｉｎｇ
- Ｓａｍｐｌｅ ｓｕｒｆａｃｅ ｐｒｅｐａｒａｔｉｏｎ ｂｙ ｕｌｔｒａｍｉｃｒｏｔｏｍｙ ｕｓｉｎｇ ａ ｄｉａｍｏｎｄ ｋｎｉｆｅ ｆｏｒ ｃｒｏｓｓ‐ｓｅｃｔｉｏｎａｌ ｅｘａｍｉｎａｔｉｏｎ ｏｆ ｖａｒｉｏｕｓ ｃｏａｔｉｎｇｓ ｏｎ ｍｅｔａｌｓ
- Ｃｒｏｓｓ‐ｓｅｃｔｉｏｎａｌ ｅｘａｍｉｎａｔｉｏｎ ｏｆ ａ ｇａｌｖａｎｉｚｅｄ ｓｔｅｅｌ
- Ｃｒｏｓｓ‐ｓｅｃｔｉｏｎａｌ ｅｘａｍｉｎａｔｉｏｎ ｏｆ ａ ｐａｉｎｔｅｄ ｓｔｅｅｌ
- Ｃｒｏｓｓ‐ｓｅｃｔｉｏｎａｌ ｅｘａｍｉｎａｔｉｏｎ ｏｆ ｓｏｌｄｅｒ ｊｏｉｎｔ ｏｆ ａ ｐｒｉｎｔｅｄ ｃｉｒｃｕｉｔ ｂｏａｒｄ〔ほか〕
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